Description
MAC – X-ray Microanalysis Reference Standards for Transmission Electron Microscopy We offer an extensive range of fully authenticated compounds and single element standards for the calibration of energy disperse X-ray detectors that are used in conjunction with transmission electron microscopes. The standards available at present are:
– Any selection from 117 Thin Film compound standards
– Universal Set of 25 compound standards
– Rare Earth Set – Thin Foil Standards Set for S.T.E.M.
– Thin Film Standards set for STEM
The holey-carbon films are supported by a 3.05mm copper grid (400 mesh). However, for analysis under critical conditions, we can supply alternative grid materials, such as beryllium or carbon composite. If requested, we can disperse the standards onto uncoated grids.
| Ag2Te | BaSO4 | Be3Al2Si6O18 | Bi2Se3 | CaM0O4 |
| CaWO4 | CdTe | CeAl2 | Cu2S | FeCr2O4 |
| GaAs | Gd3Ga5O12 | HgTe | InP | InSb |
| KAlSi3O8 | LaB6 | Li2Ta2O6 | (Mg,Fe)2SiO4 | Na3AlF6 |
| Pb-Ge glass | SrTiO3 | TlBr | ZnS | ZrSiO4 |
SPECIAL ORDERING INFORMATION: – Please supply the following information when ordering: – Make and model of instrument in which standards are to be used. – Specify quantity and standard materials required. – Outer diameter of block or individual required. – Inner diameter where appropriate. – Thickness of block (5mm normally supplied). – Whether a Faraday Cup is required. – Any limitation of the x- and y- movements of the stage. – List of element Standards.
