Description
The Gatan3View systems use special sample pins. These are used inside SEMs to create 3D imaging data of samples by serial slicing and BSD imaging. The sample pins are offered with two sample areas:_x000D_
– standard Ø1.4mm flat as sample area_x000D_
– larger Ø2.4mm flat as sample area._x000D_
These pins are fully compatible with the Gatan 3View systems; Ø2mm pin, Ø3mm head with cone top and total height of 12.5mm. Manufactured from vacuum grade aluminium._x000D_
When you need a special Gatan 3view sample stub, which is not offered on our website, please contact us. We can manufacture custom sample stubs or might be able to suggest a solution with alternative sample stubs.
