Description
EBSD analysis is a powerful microstructural crystallographic characterisation technique for crystalline or polycrystalline materials. Standard EBSD analysis on bulk samples and surfaces is performed on high-tilt samples (typically 70° from horzontal). The EBSD pattern reveals the crystal orientation and in polycrystalline materials the variation of orientation amongst the crystals. For optimum EBSD results, deformation free, polished surfaces are needed._x000D_
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Transmission EBSD analysis is only possible on (very ) thin TEM samplessuspended on a TEM grid or on a TEM lamella attached to an FIB grid. EBSD analysis on thin samples can be performed in backscatter mode at 70° tilt (from horizontal) or transmision mode at 20° (from horizontal). For transmission EBSD or t-EBSD is is imperative that transmitted electrons can reach the EBSD detector without any obstruction._x000D_
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The EM-Tec t-EBSD holders are specifically designed to generate transmission Kikuchi patterns. The transmission EBSD holders include an opening of Ø2mm in the base. The top is formed by a fork-shaped phosphor bronze clip which clamps the TEM or FIB grid. Transmission EBSD imaging and analysis is possible over the Ø2mm area._x000D_
The EM-Tec t-EBSD holders are available with 1 of 3 TEM grid capacity. The choice of configuations include:_x000D_
– EM-Tec T1 t-EBSD sample holder for a single TEM or FIB grid, standard Ø3.2mm (1/8”) pin to be mounted on existing pre-tilt holders_x000D_
– EM-Tec T3 t-EBSD sample holder for three TEM or FIB grids, standard Ø3.2mm (1/8”) pin to be mounted on existing pre-tilt holders_x000D_
– EM-Tec TE1 t-EBSD sample holder kit for a single TEM or FIB grid with 70° and 20° pre-tilt, pin / M4_x000D_
– EM-Tec TE3 t-EBSD sample holder kit for three TEM or FIB grid with 70° and 20° pre-tilt, pin / M4
