Description
The EM-Tec gripping stub and stub based vise holders are useful to grip and hold SEM samples without much need for sample preparation. Ideal for cross-section and edge-on imaging. The comprehensive selection of this type of cost-effective gripping and vise type holders is compatible with SEMs using pin stubs (FEI, Zeiss, Tescan, Phenom, Aspex), SEMs using M4 thread (Hitachi and EM-Tec SEM stage adapters) and JEOL SEMs.
